AMS

The semiconductor industry is changing rapidly. New materials and advanced production processes need advanced and innovative metrology solutions. Stay up to date with the latest trends in metrology, courtesy of the professionals of AMS. Come talk with us at one of these industry events, and let our information be your edge!

2007

Advanced Metrology Systems Continues Strong Momentum in 2007
NATICK, MA and Semicon West, San Francisco, CA, 07/17/2007

Advanced Metrology Systems Launches IR3100N
NATICK, MA and Semicon West, San Francisco, CA, 07/16/2007

Advanced Metrology Systems Announces the IR3100S for Small Spot on Product Measurements
NATICK, MA and Semicon West, San Francisco, CA, 07/16/2007

Advanced Metrology Systems Releases New SurfaceWave TM Tool for Multi-parameter Online Measurements of ECD Copper & Low-k Interconnects
NATICK, MA and Semicon West, San Francisco, CA, 07/16/2007

Watch the interview with Dr. Chris Moore, President & CEO of AMS, at Semicon West 2007!
NATICK, MA and Semicon West, San Francisco, CA,, 07/16/2007

2006

JHW Greentree Capital Invests in Advanced Metrology Systems
NATICK, MA, 10/06/2006

Does the Semiconductor Industry Need a New Approach to Metrology?
NATICK, Mass.and Semicon West, San Francisco, CA, 07/11/2006

AMS offers Proven Metrology Solution for Deep Trench DRAM Metrology
NATICK, MA, 07/11/2006

Dr. Christopher J. L. Moore Named General Manager of Advanced Metrology Systems
NATICK, MA, 06/19/2006

Advanced Metrology Systems Receives Follow-on Order from a Major Semiconductor Manufacturer
NATICK, MA, 01/18/2006

2005