Advanced Metrology Systems, LLC is a leader in designing and supplying production-ready metrology solutions for the world's finest semiconductor manufacturers. Leveraging its high-speed, non-contact, non-destructive wafer-handling platform, the AMS team of scientists and technologists develops unique advanced methodologies to measure the infinitesimal structures forming the core of twenty-first century semiconductors.
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Dr. Christopher J.L. Moore President & CEO
Mark Heber Director of Operations
Dr. Han Chang Director of Applications and Customer Support
Dr. Anthony Bonanno Director of Product Development
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