Advanced Metrology Systems, LLC is a leader in designing and supplying production-ready metrology solutions for the world's finest semiconductor manufacturers.  Leveraging its high-speed, non-contact, non-destructive wafer-handling platform, the AMS team of scientists and technologists develops unique advanced methodologies to measure the infinitesimal structures forming the core of twenty-first century semiconductors.

Dr. Christopher J.L. Moore President & CEO Mark Heber Director of Operations Dr. Han Chang Director of Applications and Customer Support Dr. Anthony Bonanno Director of Product Development